Probe card for semiconductor testing.
A probe card that excels at simultaneously measuring a large number of microchips created on a semiconductor wafer.
The "probe card" is used in the semiconductor manufacturing process during the electrical inspection known as wafer testing. Our flagship product, the "Advanced Probe Card (M-type Probe Card)," excels at simultaneously measuring a large number of microchips created on semiconductor wafers. It is used for testing DRAM and NAND flash memory, which are also incorporated in smartphones. 【Features】 ■ Excellent at simultaneously measuring a large number of microchips ■ Usable for testing DRAM and NAND flash memory ■ Incorporates advanced technology known as MEMS *Please feel free to contact us.
- Company：日本電子材料
- Price：Other
